| |||
Element | Dielectric ConstantClick to see citations | ||||
---|---|---|---|---|---|
Argon | |||||
20 °C, 1 atm |
| ||||
140 K |
| ||||
-376 °F |
| ||||
Boron | |||||
β-rhombohedral boron | |||||
parallel to crystal axis, low frequency limit |
| ||||
perpendicular to crystal axis, low frequency limit |
| ||||
parallel to crystal axis, high frequency limit |
| ||||
perpendicular to crystal axis, high frequency limit |
| ||||
Bromine | |||||
297.9 K |
| ||||
68 °F |
| ||||
32 °F |
| ||||
Calcium |
| ||||
Carbon | |||||
diamond, 300 K | |||||
103 Hz to 104 Hz, capacitance measurement |
| ||||
103 Hz, Type I |
| ||||
103 Hz, Type IIa |
| ||||
graphite |
| ||||
carbon black |
| ||||
Chlorine | |||||
liquid |
| ||||
142 °F |
| ||||
32 °F |
| ||||
-50 °F |
| ||||
208 K |
| ||||
Fluorine | |||||
-332 °F |
| ||||
53.48 K |
| ||||
Gallium | |||||
300 K, 9200 MHz |
| ||||
4.2 K | |||||
9200 MHz, microwave measurement |
| ||||
750 MHz, capacitance bridge |
| ||||
Germanium | |||||
11 component of dielectric tensor, room temperature, 34×109 Hz |
| ||||
22 component of dielectric tensor, room temperature, 34×109 Hz |
| ||||
33 component of dielectric tensor, room temperature, 34×109 Hz |
| ||||
500 Hz to 3×1010 Hz |
| ||||
4 K, 9.2×109 Hz |
| ||||
Helium | |||||
liquid |
| ||||
20 °C, 1 atm |
| ||||
2.06 K |
| ||||
helium-3, 58 °F |
| ||||
Hydrogen | |||||
440 °F |
| ||||
20 °C, 1 atm |
| ||||
13.52 K |
| ||||
deuterium, 68 °F |
| ||||
Iodine | |||||
11 component of dielectric tensor, room temperature, 5×104 Hz to 5×107 Hz |
| ||||
22 component of dielectric tensor, room temperature, 5×104 Hz to 5×107 Hz |
| ||||
33 component of dielectric tensor, room temperature, 5×104 Hz to 5×107 Hz |
| ||||
391.25 K |
| ||||
Krypton | |||||
119.8 K |
| ||||
Mercury | |||||
298 °F |
| ||||
Neon | |||||
20 °C, 1 atm |
| ||||
26.11 K |
| ||||
Nitrogen | |||||
336 °F |
| ||||
20 °C, 1 atm |
| ||||
63.15 K |
| ||||
Oxygen | |||||
68 °F |
| ||||
-315 °F |
| ||||
54.48 K |
| ||||
ozone, 90.2 K |
| ||||
Phosphorus | |||||
307.2 K |
| ||||
93 °F |
| ||||
black phosphorus |
| ||||
white phosphorus | |||||
108 Hz |
| ||||
20 °C |
| ||||
red phosphorus, 108 Hz |
| ||||
Selenium | |||||
482 °F |
| ||||
510.65 K |
| ||||
249 °F |
| ||||
300 K | |||||
monocrystal, 11 component of dielectric tensor, 24×109 Hz |
| ||||
monocrystal, 22 component of dielectric tensor, 24×109 Hz |
| ||||
monocrystal, 33 component of dielectric tensor, 24×109 Hz |
| ||||
298 K, amorphous, 102 Hz to 1010 Hz |
| ||||
68 °F |
| ||||
Silicon | |||||
300 K, 750 MHz |
| ||||
4.2 K, 750 MHz, capacitance bridge |
| ||||
Sulfur | |||||
liquid |
| ||||
powder |
| ||||
450 °F |
| ||||
407.2 K |
| ||||
244 °F |
| ||||
298 K | |||||
11 component of dielectric tensor, 102 Hz to 103 Hz |
| ||||
22 component of dielectric tensor, 102 Hz to 103 Hz |
| ||||
33 component of dielectric tensor, 102 Hz to 103 Hz |
| ||||
sublimed, 102 Hz to 103 Hz |
| ||||
Tellurium | |||||
polycrystalline |
| ||||
monocrystalline |
| ||||
11 component of dielectric tensor, low frequency limit |
| ||||
33 component of dielectric tensor, low frequency limit |
| ||||
11 component of dielectric tensor, high frequency limit |
| ||||
33 component of dielectric tensor, high frequency limit |
| ||||
Tin | |||||
gray tin, 300 K, infrared reflectance measurements |
| ||||
Xenon | |||||
161.35 K |
|
Cohen, E. Richard, David R. Lide, and George L. Trigg, editors. AlP Physics Desk Reference, 3rd edition. New York: Springer-Verlag New York, Inc., 2003.
Greenwood, N. N., and A. Earnshaw. Chemistry of the Elements, 2nd edition. Burlington, MA: Butterworth-Heinemann, 1997.
Griffiths, David J. Introduction to Electrodynamics, 2nd edition. Upper Saddle River, NJ: Prentice-Hall Inc., 1989.
Madelung, Otfried, editor. Semiconductors — Basic Data, 2nd edition. Berlin: Springer–Verlag, 1996.
Speight, James G. Perry's Standard Tables and Formulas for Chemical Engineers. New York: The McGraw-Hill Companies, Inc., 2003.
Young, K. F., and H. P. R. Frederikse. "Compilation of the Static Dielectric Constant of Inorganic Solids." Journal of Physical and Chemical Reference Data, volume 2, number 2, 1973, pp. 313–409.